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Single Crystalline Ingot
Product Code: SCI-001
Specification
| No. | Item | Specification | Unit |
| 1 | Material | Silicon | - |
| 2 | Crystal Growth Method | CZ | - |
| 3 | Conductive Type, Dopant | P-Type, Boron | - |
| 4 | Growing Direction | [100]+/-3 | degree |
| 5 | Resistivity | 3.0-6.0 [3.0-4.0 is preferable] | Ô.cm |
| 6 | Oxygen Content | Less than 1.1 x 10E18 | atoms/cm3 |
| 7 | Carbon Content | Less than 5.0 x 10E16 | atoms/cm3 |
| 8 | Lifetime (Block) | > 15 | µs |
| 9 | Dimension (Diameter) Effective Ingot Length | 154.5 + 10.0/-0.0 (as grown) 151.8 + 0.4/-0.0 (Rounded grinding) 100-400 | mm mm |
| 10 | Etch-Pit Density | Less than 3,000 | /cm3 |
| 11 | Appearance | No Crack, no contamination and no other crystal defects by naked eye | - |
| 12 | (1-1-0) node | Draw the (110) node in circle side | |
| 13 | Chip, Nick | No Chip and no nick by naked eye. But areas shown in Fig. 1 are acceptable provided that its location and size is described in check sheet. No crack or pin-holes inside ingot. | |
| 14 | Cutting right angle error | Within+/- 1.0 | degree |
| 15 | Effective Weight | ¶.r2.(L-0.4)*þ ¶=3.1415, 2r=15.18 L= Effective Length þ=2.33 | g |
Measurement Method of Effective Length at Single Crystalline Ingot
Normal Condition
Slant-Cutting Condition
Acceptable chip and nick existed in drawing slant line area
Figure 1. Crack and Nick Area
